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Dec.19_14:30_STS Testing Session

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STS Testing Session

Advanced Device Test Technologies for AI Era

STS

Friday, December 19 | 14:30 - 16:30
South Conference Room A-B / Online (Zoom)

Simultaneous interpretation

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Fee (Exclusive of tax)

  SEMI Members Non-Members Student
Early Bird (Sep17–Oct31)
*Not Valid for Online
8,000JPY 16,000JPY 4,000JPY
Regular Price (Nov1-) 10,000JPY 20,000JPY 5,000JPY

*Above fee includes "Download Presentation Materials" (some presentation materials might be written in Japanese)

  • No cancellations, changes, or refunds will be accepted after application. Please check this link before applying.
  • Please note that there are separate tickets for in-person and online participation, and also that the Early Bird tickets are available only for in-person applicants.
  • For Student applicants, your Student Visitor Badge and student ID might be checked at the venue. Please refer to the “Student Registration” page before completing your registration.

With the evolution of AI technology, test technology is becoming increasingly important to ensure the performance and reliability of AI semiconductors.
The latest trends and innovative approaches to quality assurance of next generation AI semiconductors and optimization of test processes using AI will be presented.

*Please note that the program may be subject to change.

Program Agenda

Session Chair:
Hiroshi Kaga (Advantest)
Takashi Fujiwara (TOSHIBA Electronic Device & Storage)
*In alphabetical order by company name

14:30 - 15:00
Trends in Photonics-Electronics Converged Device Technologies and Testing Challenges
Takashi Saida
Takashi Saida
VP, Head of Device Innovation Center
NTT

As the data capacity of chip-to-chip communication increases, signal integrity degradation and power consumption have become critical challenges. To address these issues, opto-electrical hybrid technology, which replaces electrical interconnects with optical signals, is attracting growing attention. This session will present the latest trends in opto-electrical hybrid technology and discuss expectations for the supporting test methodologies.

15:00 - 15:30
Silicon Photonics Test for Data Center
Kengo Suzuki
KENGO SUZUKI
Leader
Phoenix project
Advantest

Cutting edge network switches enabled with Silicon Photonics (SiPho) technology in the latest data center.
This presentation explains:
- Test insertions for each manufacturing process (equipment, instruments, test items)
- Paradigm shift of test (electrical to optical)
- Knowledge required for testing SiPho devices

15:30 - 16:00
Testing Techniques for LiDAR Laser Diodes
Yusuke Nakakohara
Yusuke Nakakohara
Senior Engineer
Optical Devices Business Division
ROHM

LiDAR for industrial and automotive applications requires longer range, laser diodes (LDs) need to be driven with high power and short pulses. This presentation will focus on the LD characterization techniques that meet this requirement.

In addition to measuring fundamental characteristics like optical power and wavelength, we'll provide a practical overview of measurement techniques for accurately capturing electrical properties under high-power, short-pulse operation, along with key considerations for evaluation circuit design.

16:00 - 16:30
Artificial Intelligence Agents Boost Engineer Productivity
Andy Kittross
Andy Kittross
Teradyne
AI Software Architect

Increasing team size can help compress time to market, but coordination overhead and scarce equipment limit this approach. Interactive AI Agents provide a new way to boost the productivity of each individual engineer, but this promise can only be achieved if AI agents are reliable, context-aware, and trustworthy.

16:30 - 17:00
Authors' Interview
 
Join us for a casual interactive opportunity where you can chat with the speakers, exchange business cards, and ask questions directly.
If you're interested, just stay in the venue after the seminar wraps up.